Home
Research
Publications
Project
Facility
People
Conference & Seminars

Facility

Facility

Cascade Microtech Probe Station

Summit wafer probing systems allow you to access the full measurement range of your parametric test instrumentation. Noise, leakage, and measurement settling times have been greatly reduced, even when using a 48-pin probe.Whatever your application: wafer-level reliability, e-test, modeling, or yield enhancement, Summit probe stations assure best-in-the-world measurements.