PUBLICATION
OF THE NORTH JERSEY
SECTION OF THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS
Last
Updated 5/16/06
May
2006
|
New!
|
= New Announcement
Not Published in Paper Newsletter
|
|
Update!
|
= Change to Meeting Time, Location, or Other Details
|
IEEE North Jersey Section
Back Issues
Back to top
May 2006
Volume
52, Number 11
Publication
No: USPS 580-500
“The IEEE Newsletter” (North Jersey Section), is published
monthly except June and July by The Institute of Electrical and Electronics
Engineers, Inc. Headquarters: 3 Park Avenue,
17th Floor, New
York, NY 10016-5997. $1.00 per member
per year (included in annual dues) for each member
of the North Jersey Section.
Periodicals-class postage paid at New York, NY
and at additional mailing offices.
Postmaster send address changes to:
“The IEEE Newsletter”, 445 Hoes Lane, P.O. Box 1331,
Piscataway, NJ 08855-1331. USPS 580-500 (ISSN 1076-3732).
NEWSLETTER
STAFF
Editor........................................... Keith Saracinello
Business
Manager...................... Keith
Saracinello
k.saracinello
“AT” ieee.org (908) 791-4067
Deadline for
receipt of material is the 1st of the month preceding the month of
publication. All communications concerning editorial and business matters,
including advertising, should be sent to the Business Manager via e-mail at
k.saracinello “AT” ieee.org or to The
IEEE Newsletter, c/o Keith
Saracinello,
25
Messenger Ln,
Ringoes,
NJ
08551,
(908) 791-4067.
IEEE NJ
SECTION HOME PAGE
http://web.njit.edu/~ieeenj/
IEEE NJ
SECTION NEWSLETTER HOME PAGE
http://web.njit.edu/~ieeenj/NEWSLETTER.html
REPORT
ADDRESS CHANGES TO:
IEEE Service
Center, 445
Hoes Lane, P.O. Box 1331, Piscataway, NJ
08855-1331, (732) 981-0060. It is not necessary to inform the North
Jersey Section when you change your mailing address. “The IEEE Newsletter” and other section
mailings use a list provided by IEEE’s national headquarters.
SECTION
OFFICERS
Chair....................................................... Har
Dayal
har.dayal
“AT” baesystems.com (973) 633-4618
Vice-Chair-1................................ Bhanu
Chivukula
b.chivukula
“AT” computer.org (732) 718-3818
Vice-Chair-2............................................. Kirit Dixit
kdixit
“AT” ieee.org (201) 669-7599
Treasurer................................. Dr. Sanghoon
Shin
s.shin
“AT” ieee.org (973) 492-1207 Ext. 22
Secretary............................................... Seth Jakel
Sgjakel
“AT” comcast.net (973) 731-1902
Members-at-Large:
Pete Donegan (doneganp “AT” ieee.org)
Amit Patel (a.j.patel “AT” ieee.org)
The North Jersey
Section Executive Committee usually meets the first Wednesday (except holidays
and December) of each month at 7:00 PM. Meetings are open to all members. For information on meeting agenda contact
Secretary Seth
Jakel (973) 731-1902, Sgjakel “AT” comcast.net.
Back to top
IEEE North Jersey
Section Activities
May
2006
May 3 – “NJ Section Meeting”, 6:30 PM, “Executive Committee
Meeting” - 7:00 PM, ITT, 100 Kingsland Rd, Clifton, NJ. Seth Jakel at sgjakel “AT” comcast.net.
May 3 – “Machine Learning for
Bioinformatic Data Mining” by Dr. S.Y. Kung, NJ SP Chapter, 4:45PM (pizza
at 4:30 PM), New Jersey Institute of Technology (NJIT), Room 202, ECE Center,
Newark, NJ. Dr. Yun Shi (973) 596-3501
(shi “AT” njit.edu), Dr. Alfredo Tan (201) 692-2347 (tan “AT” mailbox.fdu.edu),
Dr. Hong Man (201) 216-5038 (hman “AT” stevens-tech.edu).
May 4 – “Device and Process
Integration Challenges in Large Area Electronics”
by Dr. Arokia Nathan, NJ EDS/C&S Chapters, 7:00 PM (buffet at 6:15 PM), New
Jersey Institute of Technology (NJIT), Room 202, ECE Center, Newark, NJ. Dr. Richard Snyder (973) 492-1207 (RS
Microwave), Dr. Edip Niver (973) 596-3542 (NJIT), or Dr. Durga Misra (973)
596-5739 (dmisra “AT” njit.edu).
May 4 – “Fort Monmouth Annual
Information Technology Forum & Expo 2006 - IPv6 - Enabling Net-Centric
Warfare” - AFCEA Fort Monmouth Chapter Professional
Development Seminar and the North American IPv6 Task Force, 8:00AM through 4:30 PM,
Fort Monmouth Officers Club/Gibbs Hall.
Industry - Mike Dazio, mdazio “AT” datatekcorp.com, (732) 667-1080
ext.116, Government - Kwai-Fung
Chan, Kwai.Chan “AT” us.army.mil, (732) 532-3592.
May 5 – “Defect Engineering in
High-Mobility Substrates for Advanced CMOS Technologies”
by Dr. Cor Claeys, NJ EDS/C&S Chapters, 5:00 PM (pizza at 4:45 PM), New
Jersey Institute of Technology (NJIT), Room 202, ECE
Center, Newark, NJ. Dr. Richard Snyder (973) 492-1207 (RS
Microwave), Dr. Edip Niver (973) 596-3542 (NJIT), or Dr. Durga Misra (973)
596-5739 (dmisra “AT” njit.edu).
May 7 – “NJ Section Awards
Reception” - 3:00 to 6:00 PM at the Birchwood Manor, 111 North Jefferson Rd,
Whippany, NJ. Anne Giedlinski (973) 377-3175.
May 10 – “Dielectric-Charging
Model of RF MEMS Capacitive Switches” by Dr. James C. M. Hwang, NJ MTT-S/AP-S Chapter, 5:00 PM, New
Jersey Institute of Technology (NJIT), Room 202, ECE
Center, Newark, NJ. Dr. Edip Niver (973) 596-3542 (NJIT), Kirit
Dixit (201) 669-7599, kdixit "AT" ieee.org, or Har Dayal (973)
633-4618, har.dayal "AT" baesystems.com.
May 10 – “Biomedical Circuits and
Systems Dedicated to Remote Sensing and Neurostimulation”
by Dr. Mohamad Sawan, NJ EDS/C&S Chapters, 7:00 PM (buffet at 6:15 PM), New
Jersey Institute of Technology (NJIT), Room 202, ECE Center, Newark, NJ. Dr. Richard Snyder (973) 492-1207 (RS
Microwave), Dr. Edip Niver (973) 596-3542 (NJIT), or Dr. Durga Misra (973)
596-5739 (dmisra "AT" njit.edu).
May 10 – “Engineers Meet: Dysfunction by Design - the H-1B Program”
by John Miano, NJ PACE & GOLD, 6:30 – 9:00 PM, Clifton Memorial Library, 292 Piaget Ave, Clifton,
NJ. Paul Ward, (973) 790-1625 (PWard1130 “AT”
aol.com) or Richard F. Tax, (201) 664-6954 (rftax “AT” verizon.net).
TBA – “Energy Conservation
Series - Power Factor Correction” by Ron Quade, PE, NJ IAS/PES Chapters, 6:30
PM, Eaton Electrical (Cutler-Hammer),
690 Rahway Ave, Union, NJ. Ronald W. Quade, PE, (732) 205-2614 or
rwquade “AT” ieee.org
May 19 – “Montclair High School
Robotics Teams' Presentation”, 8:00 PM (coffee and desert at 7:30 PM), Union
Congregational Church, 176 Cooper
Ave, Montclair, NJ. Pete Donegan (973) 783-7998, doneganp
"AT" ieee.org.
May 25 – “IEEE CNNNJ Visitation
Program: The Art of Cold Calling”
by Donald A. Borcherding, NJ Consultants' Network, 7:30 PM,
Aeroflex/KDI-Integrated Products, 60
S. Jefferson Rd, Whippany, NJ.
Robert Walker (973) 728-0344 or www.TechnologyOnTap.org.
May 26 – “Power Cable Reliability
Seminar” by Benjamin T. Lanz, NJ IAS/PES Chapters, 9:00
AM – 2:00 PM, Automatic Switch Company, 50 Hanover Road, Florham Park,
NJ. Ronald W. Quade, PE, (732) 205-2614 or
RWQuade “AT” ieee.org
May 30 – “Safe Computing in the Age of
Ubiquitous Connectivity” - NJ Computer Chapter, 7:00 PM, Public Meeting
Room, Morris County Library, 30 E. Hanover Ave, Whippany, NJ, (973) 285-6930. Seth Jakel (973) 731 1902, (973) 820-1865,
sgjakel “AT” comcast.net or Howard Leach (973) 540-1283, h.leach “AT” ieee.org.
Upcoming Meetings
June 7 – “NJ Section Meeting”,
6:30 PM, “Executive Committee Meeting” - 7:00 PM, ITT, 100 Kingsland Rd,
Clifton, NJ. Seth Jakel at sgjakel “AT”
comcast.net.
June 15 – “Introduction to 802.16 –
WiMAX” – by Steve Crain, NJ VTS Chapter, 7:00 PM
(dinner at 6:30 PM), Lucent Technologies, 67 Whippany Rd, Whippany, NJ. Stephen Wilkowski, Lucent Technologies, (973)
386-6487, swilkowski “AT” lucent.com, Arthur Greenberg, (973) 386-6673, ahg1
“AT” lucent.com.
June 25-28 –
“The
International Conference on Dependable Systems and Networks (DSN-2006)”,
IEEE Computer Society, Sheraton Society Hill, Philadelphia, PA. Chandra Kintala, General Chair - DSN 2006,
Stevens Institute of Technology, ckintala “AT” stevens.edu.
June 29 – “RoHS - Implementation and
Compliance” by Keith James
and Tom Rainone, NJ Consultants' Network, 7:30 PM, Aeroflex/KDI-Integrated
Products, 60 S. Jefferson Rd,
Whippany, NJ. Robert Walker (973) 728-0344 or www.TechnologyOnTap.org.
Sep. 20 – “Wireless Sensor Networks”
by Dr. Martin Haenggi, NJ EDS/C&S Chapters, 7:00 PM (buffet at 6:15 PM),
New Jersey Institute of Technology (NJIT), Room 202, ECE Center, Newark,
NJ. Dr. Richard Snyder (973) 492-1207
(RS Microwave), Dr. Edip Niver (973) 596-3542 (NJIT), or Dr. Durga Misra (973)
596-5739 (dmisra “AT” njit.edu).
Oct. 17 – “Chip-Package Co-Design
of RF Microsystems” by Professor P.R. Mukund, NJ EDS/C&S
Chapters, 7:00 PM (buffet at 6:15 PM), New Jersey Institute of Technology
(NJIT), Room 202, ECE Center, Newark, NJ.
Dr. Richard Snyder (973) 492-1207 (RS Microwave), Dr. Edip Niver (973)
596-3542 (NJIT), or Dr. Durga Misra (973) 596-5739 (dmisra “AT” njit.edu).
Oct. 27 – “National Electrical
Code Update” by Won Kim, NJ PES/IAS, 9:00AM - 2:00PM, Jersey Central Power
& Light Company, 300 Madison Avenue, Morristown, NJ 07962. Ronald W. Quade (732) 205-2614 or RWQuade
“AT” IEEE.org.
Nov. 8 – “Theory and Applications
of SEM/FIB DualBeam Instrumentation” by Dr. Lucille A.
Giannuzzi, EDS/C&S Chapters, 7:00 PM (buffet at 6:15 PM), New Jersey
Institute of Technology (NJIT), Room 202, ECE Center, Newark, NJ. Dr. Richard Snyder (973) 492-1207 (RS
Microwave), Dr. Edip Niver (973) 596-3542 (NJIT), or Dr. Durga Misra (973)
596-5739 (dmisra “AT” njit.edu).
Dec. 18-21 – “9th International Conference on
Information Technology (CIT 2006)”, see http://www.citconference.org
and http://www.cs.unt.edu/~smohanty/CIT2006.
Members and Non-Members Welcome
PLEASE POST
Back to top
Spring 2006 Student Presentation Contest Held
at NJIT
The North Jersey Section student
presentation contest for 2006 was held on Tuesday, March 21st at NJIT in
Newark, NJ. The contest was well
attended and had a good number of participants.
There were a total of 8 graduate and undergraduate student presenters
covering a wide variety of topics. A
group of 4 judges volunteered their time to grade each of the speakers. The purpose of the contest is to help
students improve their communication and presentation skills. Each presenter received the judge's comment
sheets for constructive feedback.
The contest started with dinner and then
moved right into the graduate and undergraduate categories. Many different topics were covered and this
years students showed great expertise in using colorful and concise slide
presentations. Topics included everything from tutorials on semiconductors and
its applications, vehicle display systems, engineering for Iraq reconstruction,
standards, and alternative fuels.
The winners, titles, and short abstracts can
be found below. Winners in both
categories were awarded 1st/2nd/3rd place prizes. The next round of competition will be the
regional contest to be held at University of Maine, ME in mid April. All the details of their program can be found
off the SAC website http://ewh.ieee.org/r1/north_jersey/sac/ieee.html.
The North Jersey Section Presentation
contest will be again held next spring.
Greater participation is hoped and the call for presentations will start
early in November. All North Jersey
graduates/undergraduates are welcome to participate for prizes. Special thanks goes to our judges, Maurice
Baker, Russ Pepe, Pete Donegan, and Stephen Wilkowski for taking their valuable
time to support local students. Find
below pictures of some participants of the presentation contest, judges, and
some winners.
Section volunteers gave their time to help
judge the contest
Student presenters gathered for a group
photo after the contest
________________________
Purushothaman Srinivasan – 1st Place Graduate
New Jersey Institute of Technology
“Low-frequency 1/f Noise Performance in MOSFET Devices”
This talk introduces the low-frequency (1/f)
noise for analog applications in semiconductor devices. Also called as flicker noise, this is one of
the reliability factors that needs to be considered when Metal-Oxide-Semiconductor
Field-Effect-Transistors are to be considered for analog and mixed
applications. This is also used as a
reliability and diagnostic tool and performance of various MOSFET devices will
be discussed in detail during the presentation.
The impact of gate stack technological and processing parameters in
high-k based gate stacks on 1/f noise will also be outlined.
________________________
Justin Rodriguez, Timothy Garner – 1st Place
Undergrad
Stevens Institute of Technology
“Applications of Swarm Intelligence in Robotics”
Swarm intelligence has been an area of much
research in recent years due to its promise and widespread implications in the
area of robotics. Swarm intelligence can
allow multiple inexpensive robots to perform a task more efficiently than a
single expensive robot, while also allowing for a more versatile range of
functions. It can also allow multiple
robots to cooperate in a synchronous manner to perform certain tasks. The foundation of swarm intelligence is the
ability of each individual robot in a group to communicate with other robots
and assign tasks to maximize the efficiency of the group. Each robot is designated as a single memory
cell contributing to the whole. With this
collective intelligence, the “swarm” is able to maximize efficiency by having
each robot decide on a task by utilizing the information provided. This is possible even if some robots are
disabled.
________________________
Fatima Masheeb – 2nd Place Undergrad
Fairleigh Dickinson University
“Display Technologies for Automobiles”
In this presentation, the status of
automotive devices is evaluated and prospective developments in display
technologies for use in automobiles is introduced. The center of attention will be the excess of
instrumentation used to display information to the driver. It will shown that conventional display
technologies can be proficiently used to replace an abundance of secondary
instruments and a number of primary functions that will greatly decrease the
present clutter on car dashboards. It
will also be shown that by replacing existing display technologies, we can
shorten the drivers eye movement time and therefore make the driving experience
both safer for the driver and also for other drivers and pedestrians. There are a variety of choices in display
technologies that could be implemented, including active matrix liquid crystal
displays (AMLCDs), electrically controlled birefringent color LCDs, vacuum
florescent displays (VFD), LED, LCD light valves and head-up displays (HUDs);
Head Up Displays (HUD) will be focused on, which have the potential to
introduce instrumentation which follows driver eye movement. Finally, we address issues relating to the
manufacture and integration of displays for automotive instrumentation to
include cost, reliability, weight, and footprint by adopting advanced packaging
technologies.
________________________
Sowrabh Sharma – 3rd Place Undergrad
Fairleigh Dickinson University
“Wireless Speedometer using an Optocoupler”
There are many situations where signals and
data need to be transferred from one subsystem to another, within a circuit, or
from one piece of equipment to another, without making a direct ohmic
connection. Often this is because the
source and destination are (or at times may be) at very different voltage
levels. The coupling of one circuit with
respect to another, with no galvanic or ohmic connections between them, can be
achieved by using light as the mode of communication. This process is called optocoupling, and the
device used to achieve the process is called an optocoupler. For example a microprocessor which is
operating from 5V DC but being used to control a triac which is switching 240V
AC needs to be coupled with an optocoupler.
To better understand the working of optocouplers and their
implementation, I designed a speedometer that uses an optocoupler as its
central design feature. This unit can be
used to monitor speed of F-1 cars where high precision is a priority. This optocoupler is connected to a wireless
transmitter receiver circuit so that the race team can monitor the statistics
of the car from a remote location.
Back to top
NJ Computer Society:
Safe Computing in the Age
of Ubiquitous Connectivity
On Tuesday, May
30th, 2006, the IEEE North Jersey Section Computer Chapter will host a
presentation titled “Safe Computing in the Age of Ubiquitous Connectivity” by
Robert Gezelter.
About the Talk
Today’s workplace
is anywhere there is connectivity. Each development merely
expands the phenomenon, whether the
technology is public WiFi HotSpots or Cellular data services. Many employees spend the majority of their
working hours away from their offices, in an ad hoc composite of home offices, client and customer
premises, and public spaces. Ubiquitous
Internet access has accelerated this trend, with many parks, bookstores, and
coffee shops acting as virtual extensions of the office. Employees are connected to their firm and its
customers by a combination of wireless
Internet access, Virtual Private Networks, wireless devices, and mobile
telephones.
We will explore the
privacy, security, and integrity issues raised by universal connectivity; and
how technologies like wired and wireless networks, both public and private, can
be used to un-tether employees from their desks while preserving the security
and integrity of the systems they use.
The potential for information disclosure and alteration, identity theft,
misuse, and other dangers of the technology will also be explored.
Solutions will be
applicable to all participants in the connected world: end-users; enterprises; or access
providers. Enterprise issues will be addressed from the
emerging perspective of providing
cyber-hospitality, in addition to the issues raised by providing remote access
to one’s own staff.
About the
Speaker
Mr. Gezelter is a
Contributing Editor for the Computer Security Handbook. He has worked with the Internet and its
predecessor, the Arpanet, for much of his career. His experience with the Internet, combined
with his extensive experience on security related issues in financial and other
areas, resulted in his being invited to author the Internet Security chapter of
the Third Edition of The Computer Security Handbook (John Wiley and Sons, Fall
1995) and three Internet-related chapters in the Fourth Edition (John Wiley and
Sons, Spring 2002).
He has an extensive
background in the design, implementation,
and utilization of computer systems. His
clientele has spanned the full range of computing activities, from governmental administrative systems to real-time defense and process-control environments. His
work has spanned the industry, from mainframes
to embedded micro-controllers.
Mr. Gezelter’s work
has included the internals and utilization of a wide range of architectures and
platforms, work with a variety of operating systems, and work in
networking. Since 1985, he has presented
over 125 public sessions and seminars at conferences and symposia spanning the
range from one-hour conference presentations to full day seminars. He has been an invited speaker at many
symposia and a featured speaker at meetings
sponsored by several professional societies.
He has published over 25 articles in a variety of publications and has
served as a Contributing Editor for several of these.
A sampling of his
presentations can be found at http://www.rlgsc.com/presentations.html, and a selection
of his recent articles and columns can be found at http://www.rlgsc.com/publications.html.
Since 1978, Mr.
Gezelter has been in private practice emphasizing operating systems, networks,
and security. His particular focus has
been the use of architectures to improve leverage and efficiency while reducing
complexity and its attendant hazards.
Mr. Gezelter
received his BA and MS degrees in Computer Science from New York University
in 1981, and 1983 respectively.
All Welcome!
You do not have to be a member of the IEEE to attend. Bring your friends and
network during the free pre-meeting
buffet starting at 6 PM.
Time: 7:00 PM, Tuesday, May 30, 2006.
Place: Public Meeting Room, Morris County
Library, 30 E. Hanover Ave,
Whippany, NJ, (973) 285-6930.
Information:
Seth Jakel (973) 731 1902, (973) 820-1865,
sgjakel “AT” comcast.net or Howard Leach (973) 540-1283, h.leach “AT” ieee.org.
Back to
top
NJ Consultants' Network:
IEEE CNNNJ Visitation
Program: The Art of Cold Calling
On Thursday, May
25, 2006, the IEEE Consultants' Network of Northern NJ is pleased to present
”The Art of Cold Calling”, by Donald A. Borcherding..
About the Talk
Over the last year,
the CNNNJ has begun a “Visitation Program” where members
of the CNNNJ volunteer to set up appointments
and visit various companies during the afternoon of the CNNNJ monthly meetings. The goal is of this program is to meet with decision makers, provide a brochure and an
overview of the CNNNJ and, most importantly, open the CNNNJ website “http://www.TechnologyOnTap.org” to show how to
search for network members and
complete a referral form. If the mission is successful, the decision maker is
left with a CNNNJ Clock with our website boldly displayed on the front.
This presentation
will review the challenges of cold calling and how to overcome the most common
obstacles. The presentation will conclude with the visitation results and open
the floor for discussion on how to improve the Visitation Program.
About the
Speaker
Donald A.
Borcherding has helped Peter Schutz, our Vice Chairman, with the Visitation
Program, setting up appointments, making visitation calls and making cold calls
between appointments. He has used this experience to setup his own calls to
promote his firm, NexSummit LLC, which specializes in Reducing Product
Development Time and Cost.
You can reach Don
at dborcherding “AT” nexsummit.com or 908-684-8914.
About the
Consultants’ Network
Founded
in 1992, the IEEE Consultants Network of Northern NJ encourages and promotes
the use of independent technical consultants by business and industry.
All Welcome!
Everyone welcome. No registration needed. Free admission.
Time: 7:30 PM, Thursday, May 25, 2006.
Free pre-meeting buffet
starting at 6:00 PM
Place: Aeroflex/KDI-Integrated Products, 60 S. Jefferson Rd,
Whippany, NJ. (Entrance at rear of building)
Information:
For directions and up-to-date meeting status, call Robert Walker (973) 728-0344 or
visit our website at www.TechnologyOnTap.org. To
download a map to KDI, go to: http://www.mcekdi-integrated.com/directions.htm.
Back to
top
NJ Consultants' Network:
RoHS - Implementation and
Compliance
On Thursday, June
29, 2006, the IEEE Consultants' Network of Northern NJ is pleased to present
”Reduction of Hazardous Substances (RoHS) - Implementation and Compliance”, by
Keith James and Tom Rainone.
About the Talk
The IEEE CNNNJ has
organized two speakers to share their experiences with the implementation of
Reduction of Hazardous Substances (RoHS).
Hopefully, you are well into your RoHS initiative and will use this
meeting as a final check for your efforts.
If not, you will learn what it will take to reach compliance. A small sampling of what you will learn:
1.
Where to start?
2.
Who to contact?
3.
What documentation is required?
4.
Should I pursue exemptions?
5.
How do I show compliance?
6.
What about the China, US and Canada RoHS?
7.
What is required to maintain long-term
compliance?
8.
What is QC 080000 Certification?
About the
Speakers
Keith James,
Crestron Electronics
Keith presently works for Crestron Electronics, the
world’s leading manufacturer of advanced control and automation systems. He is a designer and engineering liaison
directing Manufacturing Engineering, Test Engineering, SAP Master Data and
Quality Engineering departments for sustaining existing products and leading
New Product Introductions. Keith is the
RoHS Committee Chairperson leading Crestron’s initiatives to comply with
Environmental laws and regulations within the global marketplace. He has been an active member with the Society
of Manufacturing Engineers and Northern New Jersey Chapter of APICS for over 10
years.
Crestron began their RoHS initiatives 2 years ago by
first placing an emphasis on materials management, procurement, and
configuration enhancements with their SAP system. The overall RoHS roadmap consisted of capital
expenditure, training, and design of experiments. They have more than 750 active products
considered RoHS production ready with a combined compliant component total of
over 10,000 line items. Crestron has
been producing lead-free and RoHS product since April 2005.
Tom Rainone,
Contract Manufacturing Services (CMS)
Tom has over thirty years experience in corporate
management of manufacturing companies.
Prior to founding CMS in 2003, Tom owned a mid-sized contract
manufacturing company for ten years, which gives him a unique insight into the
problems and issues of achieving RoHS compliance. He holds a Bachelors degree in Electrical
Engineering, and is a Certified IECQ Implementer for Hazardous Substance
Process Management (RoHS Compliance to QC 080000).
About the
Consultants’ Network
Founded
in 1992, the IEEE Consultants Network of Northern NJ encourages and promotes
the use of independent technical consultants by business and industry.
All Welcome!
Everyone welcome. No registration needed. Free admission.
Time: 7:30 PM, Thursday, June 29, 2006.
Place: Aeroflex/KDI-Integrated Products, 60
S. Jefferson Rd, Whippany, NJ. (Entrance at rear of building)
Information:
For directions and up-to-date meeting status, call Robert Walker (973) 728-0344 or
visit our website at www.TechnologyOnTap.org. To
download a map to KDI, go to: http://www.mcekdi-integrated.com/directions.htm.
Back to
top
NJ EDS/C&S Chapters:
Device and Process
Integration Challenges in Large Area Electronics
On May 4, 2006, the
IEEE NJ Section Electron Devices, Circuits and Systems Chapters together with
the New Jersey Institute of Technology will host a talk on “Device and Process
Integration Challenges in Large Area Electronics." The speaker will be Dr. Arokia Nathan.
About the Talk
The evolution in
materials and process fabrication technologies is posing new challenges and
application areas in large area electronics.
A driving force in this evolution is silicon thin film technology. Interest in thin film silicon extends well
beyond the active matrix liquid crystal display and stems from a variety of
desired technological features including low temperature manufacturing with few
constraints on the substrate size, material, or topology. More recently, the extension of the technology
to plastic substrates has received considerable attention. Interests on plastic is being driven by the
need for lightweight, unbreakable, and eventually foldable screens for displays
and imagers, along with a plethora of new generation applications ranging from
media to bio-medicine.
Although thin film
silicon, by virtue of material structure, does not enjoy the same electronic
properties, such as speed and current drive capability compared to crystalline
Si, it is currently being challenged with new material and device structures
that can meet performance requirements, particularly that of active matrix
organic light emitting diode (AMOLED) displays and imagers for digital
fluoroscopy/mammography. This talk will
review precisely these challenges, and address device-and materials-related
issues from the standpoint of scaling channel lengths and compacting transistor
area through use of vertical transistor structures, and nano-structuring thin
film silicon for high mobility, stability, and drive current, and more
importantly, CMOS realization for eventual system-on-panel integration at
sub-150°C for plastic compatibility.
About the
Speaker
Arokia Nathan (SM) is a Professor in
Electrical and Computer Engineering, University of Waterloo, and holds the Canada
Research Chair in Nanoscale Elastic Circuits.
He is also the chief technology officer of Ignis Innovation Inc.,
Waterloo, Canada, a company he founded to commercialize technology on thin film
silicon backplanes and driving algorithms for active matrix organic light
emitting diode displays. Dr. Nathan has
extensive experience in device physics and modeling, and materials processing
and integration. His present research interests
lie in fabrication of devices, circuits, and systems using disordered semiconductors,
including organic materials on rigid and mechanically flexible substrates for
large area electronics, for imaging and display applications. He received his PhD in Electrical Engineering
from the University of Alberta, Edmonton, Alberta, Canada, in 1988. In 1987, he joined LSI Logic Corp., Santa
Clara, CA where he worked on advanced multichip packaging techniques and
related issues. Subsequently, he was at
the Institute of Quantum Electronics, ETH Zürich, Switzerland. In 1989, he joined the Department of
Electrical and Computer Engineering, University of Waterloo. In 1995, he was a Visiting Professor at the
Physical Electronics Laboratory, ETH Zürich.
In 1997 he held the DALSA/NSERC industrial research chair in sensor
technology, and was a recipient of the 2001 Natural Sciences and Engineering
Research Council E.W.R. Steacie Fellowship.
He is currently a Visiting Professor in the Engineering Department,
University of Cambridge, UK. He has
published extensively in the field of sensor technology and CAD, and thin film
transistor electronics, and has over 15 patents filed/awarded. He is a co-author of two books,
Microtransducer CAD and CCD Image Sensors in Deep-Ultraviolet, both published
by Springer in 1999 and 2005, respectively.
He is a Senior Member of the IEEE and a member of the American Physical
Society, Electrochemical Society, Materials Research Society, Society for
Information Displays, International Society for Optical Engineering, and the
Institute of Electrical Engineers (UK).
He served as chair of the EDS-SSC society in the IEEE K-W Local Chapter,
IEEE Newsletter Editor for Region 7, and received the IEEE/EDS Distinguished
Lecturer Award in 2004. He is a member
of the IEEE EDS Publications Committee and the IEEE EDS Sub-Committee on
Organic and Polymer Devices. He chaired
the 2005 IEEE Lasers and Electro-Optics Society Technical Committee on Displays
and the Displays Sub-Committee in 2004 and 2005. He is an editorial board member of IEEE
Trans. Devices, Materials, and Reliability, and the IEEE/OSA Journal of Display
Technology. He served as one of the
co-chairs of the Fall 2005 Materials Research Society Symposium M: Flexible and
Printed Electronics, Photonics, and Biomaterials, and will co-chair the Fall
2006 Materials Research Society Symposium AA on Mobile Energy. He was a Guest Editor for a two-part Special
Issue on Flexible Electronics Technology in IEEE Proceedings.
All Welcome!
You do not have to
be a member of the IEEE to attend.
Time: 7:00 PM, Thursday, May 4, 2006. Free buffet will be starting at 6:15 PM.
Place: New Jersey Institute of Technology (NJIT),
Room 202, ECE Center, Newark, NJ.
Directions are available at http://www.njit.edu.
Information: Dr.
Richard Snyder (973) 492-1207 (RS Microwave), Dr. Edip Niver (973) 596-3542
(NJIT), or Dr. Durga Misra (973) 596-5739 (dmisra “AT” njit.edu).
Back to
top
NJ EDS/C&S Chapters:
Defect Engineering in
High-Mobility Substrates for Advanced CMOS Technologies
On May 5, 2006, the
IEEE NJ Section Electron Devices, Circuits and Systems Chapters together with
the New Jersey Institute of Technology will host a talk on “Defect Engineering in
High-Mobility Substrates for Advanced CMOS Technologies." The speaker will be Dr. Cor Claeys.
About the Talk
The scaling trend
is predicted by the ITRS roadmap.
However, the downscaling of CMOS below 45 nm has triggered the use of
high-mobility substrates in order to compensate the mobility degradation
related to the implementation of high-k dielectrics. Strain engineering has become a very popular
technique to boost up the mobility and drive current. This lecture discusses the electrical
performance of junctions and transistors processed in strained Si on thin
(250-350 nm) strain relaxed SiGe buffer (SRB) layers. The impact of the substrate (misfit and
threading dislocation density, use of a C-rich layer in the SiGe buffer, global
or locally epitaxial layer) and processing parameters (anneal conditions and
doping type) on a variety of performance parameters such as transconductance,
mobility, diode leakage current, minority carrier lifetime and low frequency
noise will be investigated. Some
physical models are proposed to explain the experimental observations. Finally, the potential and issues with
alternative high-mobility substrates such as Ge and GeOI will be briefly
highlighted.
About the
Speaker
Professor Cor Claeys was born in Antwerp,
Belgium. He received the
electrical-mechanical engineering degree in 1974 and the PhD degree in 1979,
both from the Katholieke Universiteit Leuven (KU Leuven), Belgium.
From 1974 to 1984 he was a Research Assistant
and Staff Member, respectively, of the ESAT Laboratory of the KU Leuven and
since 1990, a Professor. In 1984, he
joined IMEC as Head of Silicon Processing Group. Since 1990 he is Head of the research group
on Radiation Effects, Cryogenic Electronics and Noise Studies. He is also responsible for Technology
Business Development and is for IMEC on the management board of several
projects funded by the European Commission (NANOCMOS, SINANO, FLYING WAFER,
CADRES, STAR, EUROSOI, SEA-NET, PULLNANO…).
He is also member of the European Expert Group on Nanosciences. His main interests are in general silicon
technology for ULSI, device physics, including low-temperature operation, low
frequency noise phenomena and radiation effects, and defect engineering and
material characterization. He co-edited
a book “Low Temperature Electronics”
and wrote a book “Radiation Effects in
Advanced Semiconductor Materials and Devices”. He also authored and co-authored six book
chapters and more than 600 technical papers and conference contributions
related to the above fields. He has been
involved in the organization of a large number of international conferences and
edited more than 30 Proceedings Volumes.
He is an associated Editor for the Journal
of the Electrochemical Society.
Professor Claeys is a member of the European
Material Research Society, a Senior Member of IEEE and a Fellow of the
Electrochemical Society. He was the
founder of the IEEE Electron Devices Benelux Chapter, was Chair of the IEEE
Benelux Section was elected AdCom member of the Electron Devices Society (EDS)
(1999-2005), is an EDS Distinguished Lecture since 2004 and EDS Vice-President
for Chapters and Regions. Recently, he
has been elected as EDS President-Elect.
He also received the IEEE Third Millennium Medal. Within the Electrochemical Society he has
been serving in different committees and was Chair of the Electronics Division
(2001-2003). In 1999 he was elected as
Academician and Professor of the International Information Academy. In 2004 he received the Electronics Division
Award of the Electrochemical Society.
All Welcome!
You do not have to
be a member of the IEEE to attend.
Time: 5:00 PM, Friday, May 5, 2006. Free pizza will be offered starting at 4:45
PM.
Place: New Jersey Institute of Technology (NJIT),
Room 202, ECE Center, Newark, NJ.
Directions are available at http://www.njit.edu.
Information: Dr.
Richard Snyder (973) 492-1207 (RS Microwave), Dr. Edip Niver (973) 596-3542
(NJIT), or Dr. Durga Misra (973) 596-5739 (dmisra “AT” njit.edu).
Back to
top
NJ EDS/C&S Chapters:
Biomedical Circuits and Systems Dedicated
to Remote Sensing and Neurostimulation
On May 10, 2006,
the IEEE NJ Section Electron Devices, Circuits and Systems Chapters together
with the New Jersey Institute of Technology will host a talk on “Biomedical
Circuits and Systems Dedicated to Remote Sensing and Neurostimulation." The speaker will be Dr. Mohamad Sawan.
About the Talk
This talk will
cover techniques and methods employed to build biomedical circuits and
microsystems dedicated to implement advanced implantable and wirelessly
controlled smart medical devices (SMDs) such as sensors and microstimulateurs. A global view of typical micro-devices with a
focus on efficient inductive power transfer technique as well as high data rate
bidirectional communication will be given.
Several types of integrated low-power data modulators/ demodulators will
be discussed. In addition, case studies
related to peripheral and cortical neural systems will be reported. Selective electrical stimulator to restore
bladder functions will be presented, and multichannel intracortical monitor and
stimulator will be elaborated. Finally,
special attention will be paid to low-power management and corresponding
circuit techniques of such typical SMD.
About the
Speaker
Mohamad Sawan received his BSc in Electrical
Engineering from Université Laval (1984), and his MSc (1986) and PhD (1990),
both in Electrical Engineering, from Université de Sherbrooke. He then completed postdoctoral training at
Montréal's McGill University in 1991, and in that same year, joined École
Polytechnique de Montréal, where he is currently a Professor of
Microelectronics.
Dr. Sawan's scientific interests focus on the
design and testing of mixed-signal (analog, digital and RF) circuits and
systems; digital and analog signal processing; and the modelling, design,
integration, assembly and validation of advanced wirelessly powered and
controlled monitoring and measurement techniques. These topics are oriented toward biomedical
implantable devices and telecommunications applications. Dr. Sawan is holder of the Canada Research
Chair in Smart Medical Devices.
He heads the Microsystems Strategic Alliance
of Québec - ReSMiQ and is founder of the Eastern Canada Chapter of the
IEEE-Solid State Circuits Society. He
also founded the International IEEE-NEWCAS conference, co-founded the
International Functional Electrical Stimulation Society, and founded the
Polystim neurotechnologies laboratory at Ecole Polytechnique. He is the editor of Springer Mixed-signal
Letters, Distinguished Lecturer for the IEEE Circuits and Systems (CAS)
Society, Chair of the IEEE Biomedical CAS (BioCAS) Technical Committee, and
member of the Biotechnology Council representing the IEEE-CAS Society.
He has published more than 350 papers in
peer-reviewed journals and conference proceedings, and has been awarded seven
patents. He received the Barbara
Turnbull Award for spinal cord research, the Medal of Merit from the Lebanese
President (2005), and the J.-A. Bombardier
Award from the Association Francophone pour le savoir (ACFAS). Dr. Sawan is a Fellow of the Canadian Academy
of Engineering and a Fellow of the IEEE.
All Welcome!
You do not have to
be a member of the IEEE to attend.
Time: 7:00 PM, Wednesday, May 10, 2006. Free buffet will be starting at 6:15 PM.
Place: New Jersey Institute of Technology (NJIT), Room
202, ECE Center, Newark, NJ. Directions
are available at http://www.njit.edu.
Information: Dr.
Richard Snyder (973) 492-1207 (RS Microwave), Dr. Edip Niver (973) 596-3542
(NJIT), or Dr. Durga Misra (973) 596-5739 (dmisra “AT” njit.edu).
Back to
top
NJ EDS/C&S Chapters:
Wireless Sensor Networks
On September 20, 2006,
the IEEE NJ Section Electron Devices, Circuits and Systems Chapters together
with the New Jersey Institute of Technology will host a talk on “Wireless
Sensor Networks: A New Paradigm for
Ubiquitous Sensing and Information Processing." The speaker will be Dr. Martin Haenggi.
About the Talk
Due to the advances
in wireless communications and electronics in recent years, the development of
networks of low-cost, low-power, and multifunctional sensors has received
increasing attention. These sensors gather
and process data, and communicate with each other over a wireless channel. Various hardware platforms have already been
designed to test the many ideas spawned by the research community and to
implement applications in many fields of science and technology. This presentation gives a general
introduction to sensor networks. We will
discuss their properties, emphasizing the differences to other types of
wireless networks, including WLANs and ad hoc networks. An overview of existing hardware solutions for
sensor networks will be given, and we will conclude by discussing future
directions and developments.
About the
Speaker
Martin Haenggi received the Dipl. Ing.
(M.Sc.) degree in electrical engineering from the Swiss Federal Institute of
Technology (ETH) in 1995. In 1995, he
joined the Signal and Information Processing Laboratory at ETH as a Teaching
and Research Assistant. Between 1996 and
1998, he continued his studies and earned the Dipl. NDS ETH (post-diploma)
degree in information technology. In 1999,
he completed his PhD thesis on the analysis, design, and optimization of
cellular neural networks. After a
postdoctoral year at the Electronics Research Laboratory at the University of
California in Berkeley, he joined the faculty of the electrical engineering
department at the University of Notre Dame as an assistant professor in January
2001. He is a senior member of the IEEE,
a professional member of the ACM and the ASEE (American Society for Engineering
Education), and a reviewer for numerous international journals and
conferences. Recently he joined the
Editorial Board of the Elsevier Journal of Ad Hoc Networks. For both his MSc and his PhD theses, he was
awarded the ETH medal, and he received an NSF CAREER award in 2005. His scientific interests include networking,
wireless communications, and dynamical systems, with an emphasis on ad hoc and
sensor networks. His publications
include 3 book chapters, 21 journal publications, and 36 conference papers.
All Welcome!
You do not have to
be a member of the IEEE to attend.
Time: 7:00 PM, Wednesday, September 20, 2006. Free buffet will be starting at 6:15 PM.
Place: New Jersey Institute of Technology (NJIT),
Room 202, ECE Center, Newark, NJ.
Directions are available at http://www.njit.edu.
Information: Dr.
Richard Snyder (973) 492-1207 (RS Microwave), Dr. Edip Niver (973) 596-3542
(NJIT), or Dr. Durga Misra (973) 596-5739 (dmisra “AT” njit.edu).
Back to
top
NJ EDS/C&S Chapters:
Chip-Package Co-Design of
RF Microsystems
On October 17,
2006, the IEEE NJ Section Electron Devices, Circuits and Systems Chapters
together with the New Jersey Institute of Technology will host a talk on
“Chip-Package Co-Design of RF Microsystems." The speaker will be Professor P.R. Mukund.
About the Talk
The design of
systems that contain both RF circuitry and digital circuitry, either in a
single integrated circuit or a single package, poses challenges that are
difficult to overcome with traditional design tools. For an efficient design methodology, it is
imperative that an early design component be incorporated into the design
cycle. Further, the chip and the package
have to be designed concurrently. In
this talk, a chip package co-design methodology and a resultant software tool
will be presented. This research was
sponsored by the National Science Foundation and the Semiconductor
Corporation. In addition, related topics
of built-in self test and self calibration of RF I.C.s will also be discussed.
About the
Speaker
Professor P.R. Mukund is the Director of the
RF, Analog and Mixed-signal Laboratory (RAMLAB) at R.I.T. In this capacity, he is the principal
investigator of five research projects, sponsored by both industry and
government agencies. He is currently
supervising the research of five PhD students, whose work is based on close
interaction with companies such as LSI Logic, Freescale Semiconductors,
National Semiconductors and Kawasaki LSI.
Dr. Mukund has a BSEE, MS and PhD degrees in electrical engineering from
the University of Tennessee and has seven years of industrial experience, in
addition to seventeen years of academic experience. He has co-edited IEEE Computer, chaired
several IEEE international conferences and is currently on the Steering
Committee of the IEEE International SoC Conference. He has published in the area of analog and RF
integrated circuit design, in refereed forums.
All Welcome!
You do not have to
be a member of the IEEE to attend.
Time: 7:00 PM, Tuesday, October 17, 2006. Free buffet will be starting at 6:15 PM.
Place: New Jersey Institute of Technology (NJIT),
Room 202, ECE Center, Newark, NJ.
Directions are available at http://www.njit.edu.
Information: Dr.
Richard Snyder (973) 492-1207 (RS Microwave), Dr. Edip Niver (973) 596-3542
(NJIT), or Dr. Durga Misra (973) 596-5739 (dmisra “AT” njit.edu).
Back to
top
NJ EDS/C&S Chapters:
Theory and Applications of
SEM/FIB DualBeam Instrumentation
On November 8,
2006, the IEEE NJ Section Electron Devices, Circuits and Systems Chapters together
with the New Jersey Institute of Technology will host a talk on “Theory and
Applications of SEM/FIB DualBeam Instrumentation." The speaker will be Dr. Lucille A. Giannuzzi.
About the Talk
The basic concepts
of ion-solid interactions and focused ion beam (FIB) instrumentation and theory
will be presented. Examples of basic FIB
milling and the uses of gases for chemical vapor deposition and gas enhanced
etching will be given. The first uses of
FIB in the semiconductor industry for device modification and circuit repair
have extending into many applications, materials research, and industrial
markets. The applications of FIB and
DualBeam usage on multiple material systems in numerous industries have been
realized, and examples of FIB milling for many material systems will be
shown. Uses of the DualBeam platform for
nanotechnology applications will be described, showing that the utilization of
such a tool is limited only by one’s imagination. FIB milling techniques for specimen
preparation for scanning electron microscopy (SEM), transmission electron
microscopy (TEM), and other analytical tools will be presented. In particular, the ex-situ lift-out and
in-situ lift-out TEM techniques will be presented in detail, and the
applications of these specimen preparation methods for many TEM and Scanning
TEM techniques will be emphasized. The
concepts and advantages of a dual platform FIB and scanning electron microscope
(SEM) will be discussed. In particular,
the development of the combined FIB/SEM DualBeam instrumentation as a nano-lab
and a 3D characterization tool which including microstructure, elemental
composition, and crystallographic information will be given. Examples of using the DualBeam as a 30 keV
scanning transmission electron microscope will also be presented.
About the
Speaker
Lucille A. Giannuzzi received her BE and MS
Degrees from SUNY Stony Brook, and her PhD Degree from The Pennsylvania State
University. She spent ten years at the
University of Central Florida where she was the recipient of an NSF Career
Award. As Professor of Mechanical
Materials & Aerospace Engineering, her primary research interests included
ion/solid interactions and the microstructural evaluation of materials using
focused ion beams and transmission electron microscopy. She has been with FEI Company as a field
product marketing engineer for FIB/DualBeam systems for the past three
years. She is on the editorial board of
the journal, Microscopy and Microanalysis and participates as an instructor in
the Lehigh Microscopy School. She is
active in the local and national chapters of AVS, MSA and MAS. She has been a local affiliate speaker for
both MSA and the MAS and is co-editor of a book entitled, “Introduction to
Focused Ion Beams.”
All Welcome!
You do not have to be
a member of the IEEE to attend.
Time: 7:00 PM, Wednesday, November 8, 2006. Free buffet will be starting at 6:15 PM.
Place: New Jersey Institute of Technology (NJIT),
Room 202, ECE Center, Newark, NJ.
Directions are available at http://www.njit.edu.
Information: Dr.
Richard Snyder (973) 492-1207 (RS Microwave), Dr. Edip Niver (973) 596-3542
(NJIT), or Dr. Durga Misra (973) 596-5739 (dmisra “AT” njit.edu).
Back to
top
NJ
MTT-S/AP-S Chapter:
Dielectric-Charging Model
of RF MEMS Capacitive Switches
On May 10, 2006,
the IEEE NJ Section MTT/S/AP-S will host a talk on “Dielectric-Charging Model
of RF MEMS Capacitive Switches."
The speaker will be Dr. James C. M. Hwang.
About the Talk
Commercialization
of MEMS devices has been hindered by factors such as packaging and
reliability. In particular, the lifetime
of electrostatically actuated RF MEMS capacitive switches is currently limited
by dielectric-charging effects. To date,
dielectric-charging effects in RF MEMS devices have been studied by different
research groups with a general charge model proposed. However, there has been no effort to
experimentally extract the model parameters or to accurately model the charge
in the dielectric and its impact on actuation voltage. Under DARPA’s Harsh Environment, Robust
Micromechanical Technology (HERMIT) Program and by using a special test
structure and setup, we directly measured charging and discharging transient
currents in state-of-the-art RF MEMS capacitive switches and constructed a
simple charge model. The model can
predict charging effects on the operation of the switches under control
waveforms of different voltages, duty factors, and frequencies. By comparing with experimental data, it was
found that the model correctly predicts that the device lifetime is dependent
on voltage and duty factor, but not on frequency. Therefore, for RF MEMS capacitive switches
that fail mainly by dielectric charging, the present model can be used to
design control waveforms that can either prolong lifetime or accelerate
failure. Accelerated life testing is
important for MEMS devices because they are relatively slow. The present model can correctly predicts the
effects of different acceleration factors thus validating accelerated life
testing. This will allow the dielectric
and other material and process parameters of RF MEMS capacitive switches be
optimized relatively quickly.
About the Speaker
James C. M. Hwang
is a Professor of Electrical Engineering and Director of the Compound
Semiconductor Technology Laboratory at Lehigh University. He graduated from National Taiwan University
with a BS degree in Physics in 1970, and subsequently earned his MS (1973) and
PhD (1976) degrees in Materials Science and Engineering at Cornell
University. After twelve years of
industrial experience working at IBM, AT&T, GE, and GAIN, he joined the
Lehigh University faculty in 1988. In
2002, Professor Hwang helped establish the $40 million Center for Optical
Technologies at Lehigh University and served as its interim director for six
months. He has been a visiting professor
at Nanyang Technological University in Singapore and at Shanghai Jiaotong University
in China. He has been a consultant for
the U.S. Government and many electronic companies in the areas of RF/microwave
devices and integrated circuits.
Professor Hwang co-founded GAIN and QED; the latter became a public
company (IQEP). He has published
approximately 200 technical papers and has been granted four U.S. patents. He is a Fellow of the Institute of Electrical
and Electronic Engineers.
All Welcome!
You do not have to
be a member of the IEEE to attend.
Time: 5:00 PM, Wednesday,
May 10, 2006.
Place:
New Jersey
Institute of Technology (NJIT), Room 202, ECE Center, Newark, NJ. Directions are available at http://www.njit.edu.
Information:
Dr. Edip Niver
(973) 596-3542 (NJIT), Kirit Dixit (201) 669-7599, kdixit “AT” ieee.org, or Har
Dayal (973) 633-4618, har.dayal “AT” baesystems.com.
Back to
top
NJ PACE & GOLD Chapters:
Engineers Meet: Dysfunction by Design - the H-1B Program
On
Wednesday, May 10, 2006, the North Jersey Section Professional Activities
Committee and Graduates of the Last Decade will host a meeting to discuss the
H1-B program.
Our
guest speaker will be John Miano. His
subject will be the H1-B Program – Dysfunction by Design.
About
the Meeting
The
title of Mr. Miano’s paper is “Dysfunction by Design - The H-1B Program.” According to some the H1-B program is a
failure since it produces more problems than it solves. The talk will cover restriction on
enforcement, requirements to meet the prevailing wage, displacement of U.S.
workers, abuses of the H1-B worker, Government activity to rectify the situation.
John
will also discuss his recent paper for the Center for Immigration Studies (CIS)
on wages for the H1-B worker.
John
will have a PowerPoint presentation that will be available on line in the near
future. Time will be available for Q
& A.
You
are encouraged to attend and invite your associates. Special attention should be directed to the
IEEE-USA web: www.ieeeusa.org/policy/care/.
About
the Speaker
John
Miano has 18 years of experience in software development. He has a BA degree in mathematics from the
College of Wooster and a JD degree from Seton Hall University.
John
has been involved in the High Tech Manpower issue since 1994. His interest in High Tech Manpower began with
his experience of employer abuses of programmers and engineers.
In
1998 John started the Programmers Guild (PG).
Now a nation wide organization they hold monthly meetings. Their New Jersey PG chapter holds local
meetings in the Morris County library on the 2nd Tuesday of every month.
John
is the author of two books on Computer Programming. He has testified before Congress at
Congressional hearings on the H1-B visa and manpower issue.
All
Welcome!
Members
and students from all professional societies and engineering disciplines are
welcome. We now have attendees from
IEEE, ASME, NSPE, ASCE and AEA. For
information about these groups see:
www.aea.org
www.ieeeusa.org/policy/care/
www.ieeeusa.org
www.programmersguild.org
http://web.njit.edu/~ieeenj/
www.asme.org/sections/northjersey
CARE
is the Congressional Advocacy Recruitment
Effort CARE is a voluntary network of IEEE members
who are interested in public policy. To
HELP go to www.ieeeusa.org/policy/care/.
Time: 6:30
to 9:00 PM, Wednesday, May 10, 2006.
Refreshments will be served.
Place: Clifton
Memorial Library, 292 Piaget Ave, Clifton, NJ, (973) 772-5500.
Information: Paul
Ward, (973) 790-1625 (PWard1130 “AT” aol.com) or Richard F. Tax, (201) 664-0803
(rftax “AT” verizon.net).
Back to top
NJ PES/IAS Chapters:
Energy Conservation
Series - Power Factor Correction
On
TBA, as part of an
ongoing series of free seminars on the topic of energy conservation, the PES
and IAS Chapters will sponsor an evening discussion on energy savings
associated with power factor correction by Ronald W. Quade, PE.
About
the Meeting
The
seminar will provide the basics of power factor correction:
·
What is Power Factor?
·
Should I Be Concerned About Low Power
Factor?
·
What Can I Do to Improve Power Factor?
·
How Much Can I Save by Installing Power
Capacitors?
·
How Can I Select the Right Capacitors for My
Specific Application Needs?
·
How Much kVAR Do I Need?
·
Where Should I Install Capacitors in My
Plant Distribution System?
·
Can Capacitors Be Used in Non-Linear,
Non-Sinusoidal Environments?
·
What About Maintenance?
About
the Speaker
Ron
Quade, PE, is an Industrial and Utility Sales Manager for Eaton Electrical, a
manufacturer of electrical equipment. He
has a BS in Electrical Engineering from Rutgers University and an MS in Power
Engineering from New Jersey Institute of Technology. He is also a registered professional engineer
in the State of NJ. His prior experience
includes Power Quality Engineer with Jersey Central Power and Light and
consulting engineering with Burns & Roe Industrial Services Company..
Time: Postponed indefinitely. A new meeting date will likely be sometime in
the fall.
Place: Eaton
Electrical (Cutler-Hammer), 690 Rahway Ave, Union, NJ. Directions:
Route 82 Morris Avenue from either Springfield or Union to Rahway Ave.
Information: Ronald
W. Quade, PE, (732) 205-2614 or rwquade “AT” ieee.org.
Back to top
NJ Signal
Processing Chapter:
Machine Learning for Bioinformatic Data Mining
On
May 3, 2006, the IEEE North Jersey Section Signal Processing Society along with
NJIT will host a seminar on " Machine
Learning for Bioinformatic Data Mining."
The speaker will be Dr. S.Y. Kung.
About
the Talk
Genomic
bioinformatics represents a natural convergence of life science and information
science. The DNA sequencing and
expression profiling represent two main modalities of genomic information
sources. The genome is not just a
collection of genes working in isolation, but it encompasses global and highly
coordinated control of information to carry out a range of cellular
functions. Therefore, it is imperative
to conduct a genome-wide exploration.
Note that genome-wide analysis via pure DNA sequencing is
computationally prohibitive. In
contrast, expression of several thousands of genes can be measured
simultaneously by DNA microarrays, thus permitting discovery of clusters of
correlated genes. It is obvious that
microarray data analysis will play a vital role in the future genome-wide
bioinformatic study.
It
is crucial not only to know how to cluster data but also to find appropriate
way of looking at the genomic data. In
other words, extraction of relevant features is critical for cluster
discovery. We shall present a
comprehensive set of coherence models to better capture the biological relevant
features of genes. In addition, we adopt
as the classification architecture several existing neural networks, e.g. SVM
or decision-based neural network (DBNN).
Our fusion model is built upon the classic mixture-of-experts (MOE)
architecture: (1) a local expert is assigned to cover each modality; (2) a
gating agent is then adopted to fuse the local scores to reach a Bayesian
optimal decision. Based on the standard
yeast database, the proposed machine learning/fusion system yields satisfactory
performance in predicting several well-studied yeast gene groups e.g. ribosomal
and molecular activity genes.
With
massive amount of data having to be analyzed, genomic study will become
inevitably dependent on advanced machine learning techniques. On the other hand, any computationally based
genomic prediction remains untrustworthy until a careful and laborious
biological verification is performed.
This points to an increasingly symbiotic relationship between the
machine learning and genomic technologies.
About
the Speaker
Professor
S.Y. Kung received his PhD Degree in Electrical Engineering from Stanford
University in 1977. He was an Associate
Engineer of Amdahl Corporation, Sunnyvale, 1974, and a Professor of Electrical
Engineering-Systems of the University of Southern California, (1977-1987). Since 1987, he has been a Professor of
Electrical Engineering at the Princeton University. He held a Visiting Professorship at the
Stanford University (1984), and a Visiting Professorship at the Delft
University of Technology (1984), a Toshiba Chair Professorship at the Waseda University,
Japan (1984), an Honorary Professorship at the Central China University of
Science and Technology (1994), and a Distinguished Chair Professorship at the
Hong Kong Polytechnic University (2001-2003).
His research interests include VLSI array processors, system modelling
and identification, neural networks, wireless communication, sensor array
processing, multimedia signal processing, bioinformatic data mining, and
biometric authentication.
Professor
Kung is a Fellow of IEEE since 1988. He
served as a Member of the Board of Governors of the IEEE Signal Processing
Society (1989-1991). He was a founding
member of several Technical Committees (TC’s) of the IEEE Signal Processing
Society, including VLSI Signal Processing TC (1984), Neural Networks for Signal
Processing TC (1991) and Multimedia Signal Processing TC (1998), and was
appointed as the first Associate Editor in VLSI Area (1984) and later the first
Associate Editor in Neural Network (1991) for the IEEE Transactions on Signal
Processing. He presently serves on
Technical Committees on Multimedia Signal Processing. Since 1990, he has been the Editor-In-Chief
of the Journal of VLSI Signal Processing Systems.
Professor
Kung has co-authored more than 400 technical publications and numerous textbooks
including "VLSI and Modern Signal Processing," with Russian
translation, Prentice-Hall (1985), "VLSI Array Processors", with
Russian and Chinese translations, Prentice-Hall (1988); "Digital Neural
Networks'', Prentice-Hall (1993); "Principal Component Neural Networks'',
John-Wiley (1996); and "Biometric Authentication: A Machine Learning and Neural Network
Approach'', Prentice-Hall (2005).
Professor Kung was a recipient of IEEE Signal Processing Society's
Technical Achievement Award for his contributions on "parallel processing
and neural network algorithms for signal processing" (1992); a
Distinguished Lecturer of IEEE Signal Processing Society (1994); a recipient of
IEEE Signal Processing Society's Best Paper Award for his publication on principal
component neural networks (1996); and a recipient of the IEEE Third Millennium
Medal (2000).
Time: 4:45
PM (refreshments and pizza available at 4:30 PM), Wednesday, May 3, 2006.
Place: New Jersey Institute of Technology (NJIT),
Weston Lecture Hall 1, Newark, NJ.
Directions are available at http://www.njit.edu/University/Directions.html.
Information: Dr.
Yun Shi (973) 596-3501 (shi “AT” njit.edu), Dr. Alfredo Tan (201) 692-2347 (tan
“AT” mailbox.fdu.edu), Dr. Hong Man (201) 216-5038 (hman “AT”
stevens-tech.edu).
Back to top