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9th International Conference on Information Technology (CIT 2006) |
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Volume 53, Number 4
Publication No:
USPS 580-500
“The IEEE Newsletter”
(North Jersey Section), is published monthly except June and July by The
Institute of Electrical and Electronics Engineers, Inc. Headquarters:
NEWSLETTER STAFF
Editor...........................................
Business
Manager......................
k.saracinello
“AT” ieee.org (908) 791-4067
Deadline for receipt of material is the 1st of
the month preceding the month of publication. All communications concerning
editorial and business matters, including advertising, should be sent to the
Business Manager via e-mail at k.saracinello “AT” ieee.org or to The IEEE Newsletter, c/o
IEEE NJ SECTION HOME PAGE
IEEE NJ SECTION NEWSLETTER HOME PAGE
http://web.njit.edu/~ieeenj/NEWSLETTER.html
REPORT ADDRESS CHANGES TO:
SECTION OFFICERS
Chair.......................................................
har.dayal
“AT” baesystems.com (973) 633-4618
Vice-Chair-1................................
b.chivukula
“AT” computer.org (732) 718-3818
Vice-Chair-2.............................................
kdixit
“AT” ieee.org (201) 669-7599
Treasurer................................. Dr.
s.shin
“AT” ieee.org (973) 492-1207 Ext. 22
Secretary...............................................
sgjakel
“AT” comcast.net (973) 731-1902
Members-at-Large:
Pete
Donegan (doneganp “AT” ieee.org)
Amit
Patel (a.j.patel “AT” ieee.org)
The
October
2006
Oct. 4 – “NJ Section Meeting”,
Oct. 5 – “2006 MTT/AP Symposium and Mini-Show”
– MTT-S/AP-S Chapter,
Oct. 10 – “Digital Image Forensics”
by Dr. Yun Q. Shi, NJ SP Chapter, 4:45 PM (buffet at 4:30 PM), New Jersey
Institute of Technology (NJIT), Room 202, ECE Center, Newark, NJ. Dr. Yun Shi (973) 596-3501 (shi “AT”
njit.edu), Dr. Alfredo Tan (201) 692-2347 (tan “AT” mailbox.fdu.edu), Dr. Hong
Man (201) 216-5038 (hman “AT” stevens-tech.edu).
Oct. 11 – “Studying Brain
Connectivity with Multimodal NeuroImaging for Better Understanding Neural
Networks of Human Cognitive Process” by Dr. Zhishun Wang,
NJ SP Chapter, 4:45 PM (buffet at 4:30 PM), New Jersey Institute of Technology
(NJIT), Room 202, ECE Center, Newark, NJ.
Dr. Yun Shi (973) 596-3501 (shi “AT” njit.edu), Dr. Alfredo Tan (201)
692-2347 (tan “AT” mailbox.fdu.edu), Dr. Hong Man (201) 216-5038 (hman “AT”
stevens-tech.edu).
Oct. 11 – “Engineers Meet: Your Business”
- NJ PACE & GOLD,
Oct. 17 – “Chip-Package Co-Design of RF Microsystems”
by Professor P.R. Mukund, NJ EDS/C&S Chapters, 7:00 PM (buffet at 6:15 PM),
New Jersey Institute of Technology (NJIT), Room 202, ECE Center, Newark,
NJ. Dr. Richard Snyder (973) 492-1207
(RS Microwave), Dr. Edip Niver (973) 596-3542 (NJIT), or Dr. Durga Misra (973)
596-5739 (dmisra “AT” njit.edu).
Oct.
17-Dec. 5 – “Project Management”
by Dr. Donald Hsu, North Jersey Section, Tuesday Evenings, 8 sessions, 6:30-9:00
PM, NJ International Bulk Mail Center, 80 County Rd, Jersey City, NJ. Donald Hsu (yanyou “AT” hotmail.com).
Oct. 18 – “Energy Conservation
Series - Retro-Commissioning” by Keith Rinaldi, PE, NJ IAS/PES Chapters,
Oct. 20 – “iSpace - a Large Scale
Mechatronics System for Real-Time System-wise Optimal Control”
by Professor Mo-Yuen Chow, NJ Control Systems Chapter, 5:00-6:00 PM, New Jersey
Institute of Technology (NJIT), Room 202, ECE Center, Newark, NJ. Professor Timothy Chang (973) 596-3519
(changtn “AT” njit.edu).
Oct. 26 – “All You Wanted to Know About Reliability
Engineering!” by Dan Kamdar, NJ Consultants' Network,
Oct. 26 – “Advances in Embedded Micro-Controllers &
Design” by John Magrane, NJ SMC Society, 7:00 PM
(light refreshments at 6:45 PM), NJIT, 202 ECE Center, Newark, NJ. Dr. Mike Liechenstein, (973) 471-0721,
(m.liechenstein “AT” ieee.org), or Mengchu Zhou (mengchu.zhou “AT” njit.edu).
Oct. 27 – “National Electrical Code
Update” by Won
Upcoming Meetings
Nov. 1 – “NJ Section Meeting”,
Nov. 2– “Life Grade Luncheon”
-
Nov. 8 – “Theory and Applications
of SEM/FIB DualBeam Instrumentation” by Dr. Lucille A.
Giannuzzi, EDS/C&S Chapters, 7:00 PM (buffet at 6:15 PM), New Jersey
Institute of Technology (NJIT), Room 202, ECE Center, Newark, NJ. Dr. Richard Snyder (973) 492-1207 (RS
Microwave), Dr. Edip Niver (973) 596-3542 (NJIT), or Dr. Durga Misra (973)
596-5739 (dmisra “AT” njit.edu).
Nov. 8 – “Efficient Simulation-based Stochastic
Optimization and Its Application to Network Design and Management”
by Professor Chun-Hung Chen, NJ Control Systems Chapter, 11:30 AM - 1:00 PM,
New Jersey Institute of Technology (NJIT), Room 202, ECE Center, Newark, NJ. Professor Timothy Chang (973) 596-3519
(changtn “AT” njit.edu) or Professor Mengchu Zhou (973) 596-6282.
Nov. 15 – “Course -
Navigation: Land, Sea, Air and Space”
by Dr. Myron Kayton, AES Chapter,
Dec. 18-21
– “9th
International Conference on Information Technology (CIT 2006)”,
see http://www.citconference.org
and http://www.cs.unt.edu/~smohanty/CIT2006.
Members and Non-Members Welcome
PLEASE POST
On
About the Course
The
course will include: Overview of navigation, Coordinate Frames, Absolute
navigation versus dead reckoning, Guidance versus navigation, Tailoring
navigation to the vehicle, Terrestrial radio systems, GPS and DGPS, timing,
Dead reckoning, compass, gyroscopes and accelerometers, gimbal sets, strap-down
configurations, sensor processing, Cell-phone positioning, Spacecraft
navigation, coasting flight, powered flight, land navigation, Testing,
Calibration, initialization, and alignment, Cost and accuracy, Animal navigation,
Future trends, Bibliography: books, journals, and web sites.
About the Instructor
Dr.
Myron Kayton has 50 years of experience designing and testing avionic,
navigation, communication and computer-automation systems. He is a Consulting Engineer for his own
company. From 1968 to 1981, he was a
member of the senior staff at TRW where he served as Chief Engineer for
Spacelab avionics and head of System Engineering for Space Shuttle avionics
among scores of assignments. From 1965
to 1969, he served as Deputy Manager for Lunar Module Guidance and Control at
NASA's
All Welcome!
All
are welcome but seats are limited (first come-first served)! You do not have to
be IEEE member to attend the course.
Early registration, latest by October 31, is required to help L-3Com for
security review and allowing you access to their building.
Cost: $10 for
IEEE-AES members, unemployed and students.
$25 for all others. You are
welcome to join AES Society and pay the reduced rate.
Time:
Place: L-3Com Space and Navigation,
Information:
Dr. Naresh Chand, (973) 636-7408, naresh.chand
“AT” baesystems.com.
REGISTRATION: Navigation: Land, Sea, Air and Space by Myron
Kayton
Please mail the completed registration form
with the check (payable to “North Jersey Section IEEE”) to: Dr. Naresh Chand, BAE SYSTEMS, M/S 100A2,
Name: Dr. / Mr./ Mrs./ Miss / Ms./____________________________________________
Email address:
____________________________________
Telephone #
Business:_________________________ Home:______________________
Member of IEEE-AES Technical Society: Yes
No
If no, do you want to join AES Technical
Society: Yes
IEEE Member Member #:____________________
Member of _____________________________
technical society
Employer:_______________________________________________________________
Employer address:________________________________________________________
_______________________________________________________________________
Home
Address:___________________________________________________________
_______________________________________________________________________
Please enclose required fee payable to: North Jersey Section IEEE
As soon as a fully completed registration form
and the payment are received, you are officially registered for this course.
Registration status will be mailed through email.
Tuition receipt will be mailed only if this
box is checked
I wish to receive IEEE Completion
Certificate
Signature:___________________________________________
On Thursday,
October 26, 2006, the IEEE Consultants' Network of Northern NJ is pleased to present
” All You Wanted to Know About Reliability Engineering!”, by Dan Kamdar.
About the Talk
CNNNJ is pleased to
present a technical presentation about reliability & maintainability
engineering, systems safety, and logistics.
The Discussion will describe various terms, such as MTBF & MTTR,
Parts Stress Analysis, screening to enhance MTBF, Failure Modes Effect and
Criticality Analysis (FMECA), software reliability, associated standards,
HALT/HASS accelerated testing for earlier identification of failures, three
levels of maintenance concept, BIT analysis and demonstration, safety risks and
mitigations, Hazard Analysis, and logistics supportability and management. Software tools for performing these analyses
will also be described.
About the
Speaker
Dan Kamdar is the
President and CEO of Affordable Engineering Services, LLC, a one-stop
multi-disciplined engineering company.
He has received MBA, MSEE, BSEE and BSME degrees. His company provides consulting services in
reliability, maintainability, test, circuit design/ analysis, quality
assurance, lo¬gistics and component engineering. He has extensive background in aerospace and
defense systems, such as fighter and transport aircrafts, rockets, missiles,
space station and helicopters.
Dan can be reached
at (973) 890-8915 or by email at dkamdar “AT” affordservices.com; Affordable
Engineering Services' web site is http://www.affordservices.com.
About the
Consultants’ Network
Founded
in 1992, the IEEE Consultants Network of Northern NJ encourages and promotes
the use of independent technical consultants by business and industry.
All Welcome!
Everyone welcome. No registration needed. Free admission.
Time:
Place: Aeroflex/KDI-Integrated Products,
Information:
For directions and up-to-date meeting status,
call Robert Walker (973) 728-0344 or visit our website at www.TechnologyOnTap.org. To
download a map to KDI, go to: http://www.mcekdi-integrated.com/directions.htm.
On
About the Talk
This
presentation describes a novel concept iSpace (Intelligent Space), which is a
large scale Mechatronics System, for real-time system-wise optimal performance
using distributed sensors, distributed actuators, and distributed
controllers. The space under
consideration can be a physical space such as manufacturing plants, hospitals,
offices, universities, or a virtual space linked by communication networks
(e.g., Internet) to fuse a manufacturing plant operation in Germany with the
supervisory controller in US. The
seminar will described several challenges including the real-time integration
of distributed sensors information, distributed controller coordinators, and
collaborative distributed actuators control, and opportunities such as global
manufacturing, intelligent healthcare faculties. An unmanned ground vehicle path tracking in
iSpace at
About the Speaker
Mo-Yuen Chow earned
his degree in Electrical and Computer Engineering from the University of
Wisconsin-Madison (BS, 1982); and
Time: Time:
Place: New Jersey Institute of Technology (NJIT),
Room 202,
Information: Professor Timothy Chang (973) 596-3519
(changtn “AT” njit.edu) or Professor Mengchu Zhou (973) 596-6282.
On
About the Talk
Discrete-event
simulation is a popular tool for designing large, complex, stochastic systems,
since closed-form analytical solutions generally do not exist for such
problems. While the advance of new
technology has dramatically increased computational power, efficiency is still
a big concern when using simulation for large system design, in which case many
alternative designs must be simulated.
This presentation gives our new development to address such an
efficiency issue. A key component of our
methodologies is a new control-theoretic simulation technique called Optimal
Computing Budget Allocation invented by the speaker. Another key technique is
Ordinal Optimization, which concentrates on finding a subset of good designs by
approximately evaluating a parallel set of designs and obtains an exponential
convergence rate. We will demonstrate the effectiveness of our approach via a
series of network design problems. We
will also present an on-going project about efficient simulation and management
of the
About the Speaker
Dr.
Chen received his Ph.D. degree in Engineering Sciences from
Time: Time:
Place: New Jersey Institute of Technology (NJIT),
Room 202,
Information: Professor Timothy Chang (973) 596-3519
(changtn “AT” njit.edu) or Professor Mengchu Zhou (973) 596-6282.
On
October 17, 2006, the IEEE NJ Section Electron Devices, Circuits and Systems
Chapters together with the New Jersey Institute of Technology will host a talk
on “Chip-Package Co-Design of RF Microsystems." The speaker will be Professor P.R. Mukund.
About the Talk
The
design of systems that contain both RF circuitry and digital circuitry, either
in a single integrated circuit or a single package, poses challenges that are
difficult to overcome with traditional design tools. For an efficient design methodology, it is
imperative that an early design component be incorporated into the design
cycle. Further, the chip and the package
have to be designed concurrently. In
this talk, a chip package co-design methodology and a resultant software tool
will be presented. This research was
sponsored by the National Science Foundation and the Semiconductor
Corporation. In addition, related topics
of built-in self test and self calibration of RF I.C.s will also be discussed.
About the Speaker
Professor P.R. Mukund is the
Director of the RF, Analog and Mixed-signal Laboratory (RAMLAB) at R.I.T. In this capacity, he is the principal
investigator of five research projects, sponsored by both industry and government
agencies. He is currently supervising
the research of five PhD students, whose work is based on close interaction
with companies such as LSI Logic, Freescale Semiconductors, National
Semiconductors and Kawasaki LSI. Dr.
Mukund has a BSEE, MS and PhD degrees in electrical engineering from the
University of Tennessee and has seven years of industrial experience, in
addition to seventeen years of academic experience. He has co-edited IEEE Computer, chaired
several IEEE international conferences and is currently on the Steering
Committee of the IEEE International SoC Conference. He has published in the area of analog and RF
integrated circuit design, in refereed forums.
All Welcome!
You
do not have to be a member of the IEEE to attend.
Time: 7:00 PM, Tuesday, October 17,
2006. Free buffet will be starting at
6:15 PM.
Place: New Jersey Institute of Technology (NJIT),
Room 202,
Information: Dr. Richard Snyder (973) 492-1207 (RS
Microwave), Dr. Edip Niver (973) 596-3542 (NJIT), or Dr. Durga Misra (973)
596-5739 (dmisra “AT” njit.edu).
On
November 8, 2006, the IEEE NJ Section Electron Devices, Circuits and Systems
Chapters together with the New Jersey Institute of Technology will host a talk
on “Theory and Applications of SEM/FIB DualBeam Instrumentation." The speaker will be Dr. Lucille A. Giannuzzi.
About the Talk
The
basic concepts of ion-solid interactions and focused ion beam (FIB) instrumentation
and theory will be presented. Examples
of basic FIB milling and the uses of gases for chemical vapor deposition and
gas enhanced etching will be given. The
first uses of FIB in the semiconductor industry for device modification and
circuit repair have extending into many applications, materials research, and
industrial markets. The applications of
FIB and DualBeam usage on multiple material systems in numerous industries have
been realized, and examples of FIB milling for many material systems will be
shown. Uses of the DualBeam platform for
nanotechnology applications will be described, showing that the utilization of
such a tool is limited only by one’s imagination. FIB milling techniques for specimen
preparation for scanning electron microscopy (SEM), transmission electron
microscopy (TEM), and other analytical tools will be presented. In particular, the ex-situ lift-out and
in-situ lift-out TEM techniques will be presented in detail, and the applications
of these specimen preparation methods for many TEM and Scanning TEM techniques
will be emphasized. The concepts and
advantages of a dual platform FIB and scanning electron microscope (SEM) will
be discussed. In particular, the
development of the combined FIB/SEM DualBeam instrumentation as a nano-lab and
a 3D characterization tool which including microstructure, elemental
composition, and crystallographic information will be given. Examples of using the DualBeam as a 30 keV
scanning transmission electron microscope will also be presented.
About the Speaker
Lucille A. Giannuzzi
received her BE and MS Degrees from SUNY Stony Brook, and her PhD Degree from
The Pennsylvania State University. She
spent ten years at the University of Central Florida where she was the recipient
of an NSF Career Award. As Professor of
Mechanical Materials & Aerospace Engineering, her primary research
interests included ion/solid interactions and the microstructural evaluation of
materials using focused ion beams and transmission electron microscopy. She has been with FEI Company as a field
product marketing engineer for FIB/DualBeam systems for the past three
years. She is on the editorial board of
the journal, Microscopy and Microanalysis and participates as an instructor in
the Lehigh Microscopy School. She is
active in the local and national chapters of AVS, MSA and MAS. She has been a local affiliate speaker for
both MSA and the MAS and is co-editor of a book entitled, “Introduction to
Focused Ion Beams.”
All Welcome!
You
do not have to be a member of the IEEE to attend.
Time: 7:00 PM, Wednesday, November
8, 2006. Free buffet will be starting at
6:15 PM.
Place: New Jersey Institute of Technology (NJIT),
Room 202,
Information: Dr. Richard Snyder (973) 492-1207 (RS
Microwave), Dr. Edip Niver (973) 596-3542 (NJIT), or Dr. Durga Misra (973)
596-5739 (dmisra “AT” njit.edu).
On
About
the Meeting
All
will have an opportunity to present their views about the profession, the job
market, review past meetings and discuss pressing issues for PACE.
Bring
job leads and information. And get on
our Email list.
All
Welcome!
Members
and students from all professional societies and engineering disciplines are
welcome. We now have attendees from
IEEE, ASME, NSPE, ASCE and AEA. For
information about these groups see:
www.asme.org/sections/northjersey
Time:
Place:
Information: Paul
Ward, (973) 790-1625 (PWard1130 “AT” aol.com) or Richard F. Tax, (201) 664-0803
(rftax “AT” verizon.net).
On
October 18, 2006, as part of an ongoing series of free seminars on the topic of
energy conservation, the PES and IAS Chapters will sponsor an evening
discussion on Retro-Commissioning by Keith Rinaldi.
About
the Meeting
Are
calibration and scheduling issues unnecessarily increasing your operating
costs? Are you confident that mold and
indoor air quality issues are not a problem in your facility? Just because space temperature and humidity
control are excellent, doesn’t mean the HVAC systems are as efficient as they
can be.
Retro-commissioning
is a rigorous and systematic process of discovering and correcting HVAC/
utility system defects in existing systems so that the building will function
as intended. The presentation will
include of overview of the retro-commissioning process and its stages of
discovery and analysis. With simple
paybacks of less than 12 months, retro-commissioning can be a quick and easy
way for you to lower your energy costs and increase your building’s efficiency.
Attendees
will gain a basic understanding of the process and its benefits and what to
look for in a qualified retro-commissioning provider.
About
the Speaker
The
presenter will be Keith Rinaldi, Vice President, Field Engineering Services.
A
founding member of the field engineering group, Keith A. Rinaldi has been with
Dome-Tech since 1992. With over 14 years
of experience, Keith has developed expertise in problem solving and the
optimization of all major plant utility systems including boilers, steam
distribution and condensate return systems, compressed air systems, chillers,
cooling towers, pumps, chilled water distribution, air handlers and air
distribution systems.
Keith
was a key member of the team which established and formalized Dome-Tech’s
retro-commissioning process.
Retro-Commissioning is a systematic process of reviews, inspections and
testing which ensures systems have been designed, installed and operate
properly to efficiently meet the needs of the building’s occupants. In the last five years he has been personally
involved in and supervised retro-commissioning projects for over 3 million square
feet of office, laboratory, production and school facilities.
In
addition to retro-commissioning, Keith’s project experience includes:
·
The evaluation and optimization of countless
steam and condensate systems in the tri-state area.
·
The evaluation and optimization of numerous
>3,000 ton central chilled water plants.
·
Failure analysis of two engine driven
chillers. Provided independent testing
and analysis for litigation purposes.
·
Owner’s representative for the acceptance
testing of a 100 MW cogeneration unit.
·
Provided specialty TAB services for
pharmaceutical and health care HVAC systems.
As the President of Field Engineering
Services, Keith is ultimately responsible for the day-to-day operations and
management of all field engineering projects.
He is an integral part of the Dome-Tech Group’s senior management team,
developing the strategic direction of the company as a whole.
Time: 6:30
PM, Wednesday, October 18, 2006. A pre-meeting buffet will be available
starting at 6:00 PM.
Place: Eaton
Electrical (Cutler-Hammer), 690 Rahway Ave, Union, NJ. Directions:
Route 82 Morris Avenue from either Springfield or Union to
Information: Ronald
W. Quade, PE, (732) 205-2614 or rwquade “AT” ieee.org.
On
About
the Talk
In
our digital age, digital media have been being massively produced, easily
manipulated, and swiftly transmitted almost anywhere and anytime. Digital data forensics, which gathers
evidence of data composition, origin, and history, is called for information
assurance. In this talk we discuss three
subjects in forensics. First, we report
a newly developed method to detect spliced images, in which statistical moments
of characteristic functions derived from image magnitude and phase congruency
derived from image phase are utilized for image tampering detection. We then briefly present a Markov process
based steganalytic scheme, which can effectively detect existence of data embedded
by modern steganography, in particular, OutGuess, F5 and MB. Finally, we show a generalized Benford law,
which can be used to detect JPEG compression history for bmp images.
About
the Speaker
Dr.
Yun Q. Shi has been a member of the Department of Electrical and Computer
Engineering at New Jersey Institute of technology since Fall 1987. His research interests include visual signal processing and communications,
digital multimedia data hiding and information assurance, applications of
digital image processing, computer vision and pattern recognition to industrial
automation and biomedical engineering, theory of multidimensional systems and
signal processing. He is an
author/coauthor of 190 papers in his research areas, a book on Image and Video
Compression, three book chapters on Image Data Hiding and one book chapter on
Digital Image Processing. He holds two
Time:
Place: New Jersey Institute of Technology (NJIT),
Room 202,
Information: Dr.
Yun Shi (973) 596-3501 (shi “AT” njit.edu), Dr. Alfredo Tan (201) 692- 2347
(tan “AT” mailbox.fdu.edu), Dr. Hong Man (201) 216-5038 (hman “AT”
stevenstech.edu).
On
About
the Talk
Distributed
networks (connections among different regions) of the brain govern human
behavior. It becomes increasingly clear
that such connections can be non-invasively detected by using functional
magnetic resonance imaging (functional MRI or fMRI). As a powerful tool of non-invasive brain
mapping, fMRI has evolved in various domains into a methodology for addressing
questions with regard to functional topography, for testing hypothesis about functions
of brain structures and networks, and for elucidating the underlying
neurophysiological mechanisms. Some have
started to explore the potential of fMRI measures as endophenotype markers for
psychopathological disorders. A common
objective in functional imaging is to characterize the activity in a particular
brain region in terms of the interactions among inputs from other regions or by
the interaction between inputs from another region’s activity and a behavior
state. The analysis of fMRI time-series
data recorded from human brain can provide information not only about
task-related activity, but also about the connectivity (functional or
effective) among brain regions and the influences of behavioral or physiologic
states on that connectivity. One of the
exciting possible applications of such an analysis is that researchers could
use the information based on the functional connectivity extracted from fMRI
data primarily to make inferences about human cognitive process.
During
this presentation, Dr. Wang will extensively introduce his works in studying
brain connectivity with Multimodal (Multimodality) NeuroImaging techniques,
including fMRI, Diffusion Tensor Imaging (DTI), Magnetic Resonance Spectroscopy
(MRS), EEG, Optical Imaging and their combinations. Dr. Wang has developed two neural network
models, Generalized Minimum Fuel Neural Networks (GMFNN) and Constrained Least
Absolute Deviation Neural Networks (CLADNN) that are suitable for the robust
analysis of functional connectivity from fMRI time series. Dr. Wang has proposed a novel clustering
method, called Partner Matching (PM) for automatically identifying independent
components that represent neuronal and non-neuronal sources and are generated
by applying an
About
the Speaker
Dr.
Zhishun Wang graduated from
Dr.
Wang is currently an Assistant Professor of Clinical Psychiatry with Brain imaging
Center of Columbia University in
Dr.
Wang is now a Senior Member of IEEE and he has been recognized as an
Outstanding Scientist by Whos’ Whos in
Time:
Place: New Jersey Institute of Technology (NJIT),
Room 202,
Information: Dr.
Yun Shi (973) 596-3501 (shi “AT” njit.edu), Dr. Alfredo Tan (201) 692- 2347
(tan “AT” mailbox.fdu.edu), Dr. Hong Man (201) 216-5038 (hman “AT”
stevenstech.edu).
On
About
the Talk
The
focus of the presentation will be on Microchip’s new series of 16 bit microcontrollers
and digital signal controllers.
About
the Speaker
John
Magrane is the Technical Training Manager for the
All
Welcome!
You
need not be a member of IEEE to attend, and there is no charge for
admission. Light refreshments will be
served starting at
Time: 7:00
PM (light refreshments at
Place: New Jersey Institute of Technology (NJIT),
Room 202,
Information/RSPV: Dr.
Mike Liechenstein, (973) 471-0721, (m.liechenstein “AT” ieee.org).
Please RSVP
prior to the presentation since space is limited, as well as for getting
instructions for accessing the secured parking deck at NJIT. Also check electronic newsletter for any
possible changes in room, etc.