Facility

HP 4145B semiconductor parameter analyzer is a fully automatic, high performance programmable test instrument designed to measure, analyze, and graphically display the DC characteristics of a wide range of semiconductor devices, such as diodes, bipolar transistors, field effect transistors, wafers, ICs etc. Main application include Computer Aided Design (CAD) of ICs, new device evaluation, material evaluation, component selection for circuit design, incoming/outgoing inspection, semiconductor process control, quality control and quality assurance. It is equipped with four programmable Source Monitor Units (SMU), tow programmable voltage source units, and fully interactive graphics display, removable flexible disc storage, softkeys, fully arithmetic keyboard, and HP-I. It can be used on the bench or as part of complete measurement system in the laboratory or on a production line.