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The state-of-the art setup for optical characterization includes Silicon and InGaAs diode array photodetectors, InGaAs photomultiplier, spectrometers, excitation sources (CW and pulsed lasers), and optical cryostats.

High-resolution Raman scattering setup is capable of measuring inelastic light scattering with spectral resolution of 0.25 cm-1 and spectral shift of the laser line better when 10 cm-1

Lamp heated rapid thermal chemical vapor deposition setup for fabrication of silicon and germanium nanostructures

Janus optical Cryo-system with a superconducting magnet

Electrical Prop station with zoom stereo microscope

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Maintained by Department of Electrical & Computer Engineering. Date of last update:Last updated: 07/21/05.