Development
of a Silicon Detector for Synchrotron Based X-Ray Spectroscopy,
X-Ray Holography and Materials Education
Investigators: Trevor A. Tyson, New Jersey
Institute of Technology (tyson@adm.njit.edu,
tel: 973-642-4681)
Chi-Chang Kao, National Synchrotron Light Source, BNL (kao@bnl.gov, tel: 631-344-4494)
D. Peter Siddons, National Synchrotron Light Source, BNL (siddons@bnl.gov,
tel: 631-344-2738)
Jianming Bai, University of Tennessee and Oakridge National Laboratory (bai@bnl.gov, tel: 631-344-2583)
Gianluigi De Geronimo, Instrumentation Division, BNL, (degeronimo@bnl.gov, tel: 631-344-5336)
Funding Source: National Science
Foundation, Major Research Instrumentation Grant DMR 0722730
Contacts for Access: Trevor A. Tyson, New Jersey Institute of Technology (tyson@adm.njit.edu,
tel: 973-642-4681)
D. Peter Siddons, National Synchrotron Light Source, BNL (siddons@bnl.gov, tel: 631-344-2738)
Jianming Bai, University of Tennessee and Oakridge National Laboratory (bai@bnl.gov, tel: 631-344-2583)
Abstract
Synchrotron
spectroscopy has developed into a powerful approach to probe the atomic and
electronic properties in materials varying from correlated electron systems to
catalysts and extending to active metal sites in protein molecules. In many
x-ray experiments, the detector systems currently available can not cope with
the high flux of x-ray photons generated by synchrotron sources while still
maintaining adequate energy resolution.
To address this and other problems, we propose to develop a
new detector system which will have at least a fifty-fold increase in counting
rate over existing commercial systems while maintaining the high resolution
required to suppress unwanted background radiation. This will be accomplished by
increasing the active element density (~400 elements), by the use of silicon
drift-detector technology and a new very low-noise front-end Application
Specific Integrated Circuit (ASIC), and by the application of sophisticated
signal analysis techniques to enhance the suppression of unwanted signals and to
provide real-time quantitative elemental mapping. The proposed project will
build on the experience of the Brookhaven National Laboratory's NSLS Controls
and Detectors and Instrumentation Division groups in developing monolithic x-ray
detector arrays and custom integrated circuits, expertise in spectroscopy and
instrument development at the New Jersey Institute of Technology and the NSLS,
and expertise in x-ray holography and diffraction methods developed by the
University of Tennessee.
At all levels of the construction and research conducted with
this detector, graduate students will be involved. The proposed instrument will
have a broad impact through the education of graduate and undergraduate students
based on its use in laboratory courses. The instrument will be utilized as a
chemical analysis tool in a transition metal oxide preparation and
characterization workshop for Newark area high school students. This will serve
to develop scientific literacy and to directly influence students from
underrepresented groups to pursue careers in science.
Summary of Current Progress (Three Detectors Under Construction/Development)
384 Element Diode Detector
Characterization
and Commissioning of of 384 Element Diode Detector
Emission Profiles of 384 Element Detector
96 Element Full-Spectrum Maia Diode Detector
96-Element Full
Spectrum Detector Development and Characterization (Arthur Li's Thesis)
64 Element High Count-Rate Silicon Drift Detector
IC Design is based on Cadence Software